ICT 300
The ICT 300, SEMILAB QC's proprietary Implant Characterization Tool, measures the dynamic surface photo-charge signal which provides the high sensitivity required for effective process monitoring of advanced CMOS and Bipolar implant tolerances. The ICT 300 monitors dose, energy, and angle variations to help keep the implant process in control. SEMILAB QC provides the expertise, commitment and support to help you customize a sensitivity curve for a particular application.